The research activity of this group is aimed to the surface characterization by using Secondary Ion Mass Spectrometry (SIMS) technique. SIMS is the most sensitive surface analysis technique (ppb), capable of sub-nanometer depth resolution and a lateral resolution of 60 nm. SIMS can be used to measure all elements and isotopes in the periodic table. In the depth profiling studies, SIMS is used to determine the composition as a function of depth. Furthermore, it is possible to perform SIMS imaginganalyses where the lateral distribution of elements of interest are measured. SIMS depth profiling and imaging may be combined to yield a three-dimensional SIMS chemical map of a material.

In particular, the members of the group are active in the following research lines:

• Characterization of inorganic materials for application in electronic field.
• Characterization of biocompatible metallic and polymeric materials.
• Cluster SIMS Imaging.
• Applications of Secondary Ion Mass Spectrometry to cultural heritage studies.
• Application of FT-IR and Vis spectroscopy to material science field
• Chemometrics – Multivariate Analysis.